Dr. Gilliss holds a Ph.D. in Materials Science and Engineering, and a Bachelor of Chemical Engineering with a minor in Chemistry. She possesses hands-on experience in semiconductor processing and its associated characterization techniques. Dr. Gilliss’s research experience includes thin-film deposition techniques, in particular pulsed-laser deposition. During graduate school, her research required extensive nano-scale characterization, resulting in Dr. Gilliss's proficiency in: transmission-electron microscopy; electron-energy loss spectroscopy; scanning-electron microscopy; energy-dispersive X-ray spectroscopy; and atomic-force microscopy to name a few.
During her time at Seagate, Dr. Gilliss characterized the magnetostrictive properties of thin films and used focused-ion beam techniques in combination with transmission-electron microscopy to characterize a variety of hard-drive components.
Dr. Gilliss’s Ph.D. thesis focused on glass/ceramic surfaces and interfaces. Her analysis of the valence state of the Cerium-oxide surface contributed to the fundamental understanding of the chemical-mechanical polishing mechanism.
- Session Chair, XVIth International Symposium on the Reactivity of Solids (June 2007)
- Oak Ridge National Laboratory, Participant in the ShaRe Program—a government funded collaborative research program (2002-2004)
- Lawrence Berkeley National Laboratory, visiting user of the National Center for Electron Microscopy (2002-2004)
- 3M, Abrasives Division Intern (Summer 2000 and 2001)
- Seagate Technology, Intern (Summer 1999)
- U.S. Senator Kent Conrad, Intern (1994)