Dr. Gilliss leads diverse, cross-disciplinary teams that complement Robins Kaplan’s litigation services. Her teams are experts in ediscovery, business intelligence, and include specialized consultants who provide expertise in science and technology, as well as finance, accounting and economics.
Dr. Gilliss holds a Ph.D. in Materials Science and Engineering, and a Bachelor of Chemical Engineering with a minor in Chemistry. She possesses hands-on experience in semiconductor processing and its associated characterization techniques. Dr. Gilliss’s research experience includes thin-film deposition techniques, in particular pulsed-laser deposition. During graduate school, her research required extensive nano-scale characterization, resulting in Dr. Gilliss's proficiency in: transmission-electron microscopy; electron-energy loss spectroscopy; scanning-electron microscopy; energy-dispersive X-ray spectroscopy; and atomic-force microscopy to name a few.
During her time at Seagate, Dr. Gilliss characterized the magnetostrictive properties of thin films and used focused-ion beam techniques in combination with transmission-electron microscopy to characterize a variety of hard-drive components.
Dr. Gilliss’s Ph.D. thesis focused on glass/ceramic surfaces and interfaces. Her analysis of the valence state of the Cerium-oxide surface contributed to the fundamental understanding of the chemical-mechanical polishing mechanism.
- Session Chair, XVIth International Symposium on the Reactivity of Solids (June 2007)
- Oak Ridge National Laboratory, Participant in the ShaRe Program—a government funded collaborative research program (2002-2004)
- Lawrence Berkeley National Laboratory, visiting user of the National Center for Electron Microscopy (2002-2004)
- 3M, Abrasives Division Intern (Summer 2000 and 2001)
- Seagate Technology, Intern (Summer 1999)
- U.S. Senator Kent Conrad, Intern (1994)
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